ONEM

Optical Near-field electron microscopy is a new idea for a microscope that uses the best of two worlds: Non-damaging probing with light, and high resolution using an electron-based read-out. The envisioned technique is damage-free, requires no labels, and allows for a resolution on the nanometer scale.

A detailed description of the proposal can be found here.

20.08.2024
 

A camera in Salzkammergut captures a photo with a 1000-year long exposure time!

27.06.2024
 

Unified Simulation Platform for Interference Microscopy

13.06.2024
 

Growth of ultra-flat ultra-thin alkali antimonide photocathode films

11.06.2024
 

Exhibition at the European Capitol of Culture 2024!

11.06.2024
 

Our PhD student Hanieh Jafarian at MIT doing her secondment.

24.05.2024
 

Quantum limits of position and polarizability estimation in the optical near field