Upcoming sessions:
Reducing electron beam damage
Tue 21.06.2022
David J. Flannigan "Effects of Controlled Electron Emission on Specimen Damage"
Associate professor, Department of Chemical Engineering and Materials Science
University of Minnesota
Layla B. Mehdi "Understanding and Controlling Radiolysis Chemistry on the Nanoscale By Operando STEM"
Associate director, Albert Crewe Centre (ACC)
Associate professor, University of Liverpool
Jo Verbeek “Beam damage reduction in STEM through alternative scan strategies”
Professor, Electron microscopy for materials science
University of Antwerp
Correlative Electron Microscopy
Tue 28.6.2022
Jacob Hogenboom "From millimeters to molecules: multi-scale correlative microscopy with coincident photon, electron, and ion beams"
Associate professor, Department of Imaging Physics
Delft University of Technology
Thomas H. Sharp "Super-resolution CryoCLEM"
Assistant professor
Leiden University
Raphaël Marchand "Optical Near-field Electron Microscopy"
Quantum optics, Quantum Physics, Quantum Information
University of Vienna
Time-resolved Electron Microscopy
Tue 5.7.2022
Jom Luiten "Dynamic phase space shaping for Ultrafast Transmission Electron Microscopy"
Professor, Applied Physics, Coherence and Quantum Technology,
Center for Quantum Materials and Technology Eindhoven,
Professor, ICMS Core
Ulrich Lorenz “Towards Microsecond Time-resolved cryo-EM”
Professor, Laboratory of Molecular Nanodynamics LND
Ecole Polytechnique Fédérale de Lausanne
Kristian Mølhave “Nanofluidic TEM – new insights using nanochannels for liquid phase electron microscopy”
Professor, National center for Nano Fabrication and Characterization
Technical University of Denmark
Quantum Metrology in Electron Microscopy
Tue 12.7.2022
Claus Ropers
University Göttingen
Stewart A. Koppell "TEM at the Quantum limit"
Stanford University
Amy Turner "Interaction-free measurements with electrons"
University of Oregon