Publications
The idea behind ONEM is described here:
Optical Near-Field Electron Microscopy
R. Marchand, R. Šachl, M. Kalbáč, M. Hof, R. Tromp, M. Amaro, S. J. van der Molen and T. Juffmann
Phys. Rev. Applied 16, 014008 (2021).
And here (in Dutch):
Optische nabije-veldelektronenmicroscopie (ONEM)
W.G. Stam, A. Moradi, S.J. van der Molen
NEVAC blad 59 | 3 (2021).
ONEM builds on previous work of our collaboration partners. If you're interested, have a look at the following publications:
LEEM:
D. Geelen, J. Jobst, E. E. Krasovskii, S. J. Van Der Molen, and R. M. Tromp, Phys. Rev. Lett. 123, (2019).
R. M. Tromp, J. B. Hannon, A. W. Ellis, W. Wan, A. Berghaus, and O. Schaff, Ultramicroscopy 110, 852 (2010).
Low-damage electron microscopy
M. J. Williamson, R. M. Tromp, P. M. Vereecken, R. Hull, and F. M. Ross, Nat. Mater. 2, 532 (2003).
T. Juffmann, S. A. Koppell, B. B. Klopfer, C. Ophus, R. M. Glaeser, and M. A. Kasevich, Sci. Rep. 7, 1699 (2017).
Protein dynamics in lipid bilayers
A. P. G. Dingeldein, Š. Pokorná, M. Lidman, T. Sparrman, R. Šachl, M. Hof, and G. Gröbner, Biophys. J. 112, 2147 (2017).
M. Lidman, Š. Pokorná, A. P. G. Dingeldein, T. Sparrman, M. Wallgren, R. Šachl, M. Hof, and G. Gröbner, Biochim. Biophys. Acta - Biomembr. 1858, 1288 (2016).
Take a look at ONEM's latest publications:
The minimal membrane requirements for BAX-induced pore opening upon exposure to oxidative stress
P. Mystek, V. Singh, M. Horváth, K. Honzejková, P. Riegerová, H. Evci, M. Hof, T. Obšil and R. Šachl
Biophysical Journal 123, 20, 3519 - 3532 (2024).
Growth of ultra-flat ultra-thin alkali antimonide photocathode films
W. G. Stam, M. Gaowei, E. M. Echeverria, K. Evans-Lutterodt, J. Jordan-Sweet, T. Juffmann, S. Karkare, J. Maxson, S. J. van der Molen, C. Pennington, P. Saha, J. Smedley and R. M. Tromp
APL Mater. 12, 061114 (2024).
A structural analysis of ordered Cs3Sb films grown on a single crystal graphene and silicon carbide substrates
C. Pennington, M. Gaowei, E. M. Echeverria, K. Evans-Lutterodt, A. Galdi, T. Juffmann, S. Karkare, J. Maxson, S. J. van der Molen, P. Saha, J. Smedley, W. G. Stam and R. M. Tromp
arXiv:2407.12224 (2024)
Unified Simulation Platform for Interference Microscopy
F. Hitzelhammer, A. Dostálová, I. Zykov, B. Platzer, C. Conrad-Billroth, T. Juffmann and U. Hohenester
Phys. Rev. Research 6, 023204 (2024).
Interleaflet organization of membrane nanodomains: What can(not) be resolved by FRET?
B. Chmelová, D. Davidović and R. Šachl
Biophysical Journal 122, 11, 2053 - 2067 (2023).
Back illuminated photo emission electron microscopy (BIPEEM)
A. Moradi, M. Rog, W. G. Stam, R. M. Tromp and S. J. van der Molen
Ultramicroscopy, 253, 113809 (2023).